Skip to main content

Microscopic Characterization of functional and nanostructured materials (MICA)

pftplus |

     Scanning probe microscope     Atomic Force Microscope (AFM) Icon (BRUKER)     Scanning Electron Microscope (SEM)     Raman spectrometer (THERMOFISHER)

Technical and scientific expertise

Microscopic characterisation in materials science, chemistry, solid state physics and (bio)nanotechnology

Main equipment

  • Optical and electron microscopes (SEM, TEM)
  • Local probe microscopes (STM, AFM)
  • Spectroscopes (FTIR, Raman)

Get an overview of the platform’s facilities via a virtual tour.

Applications

  • Materials science
  • Chemistry
  • Solid state physics
  • (Bio)Nanotechnology

Services available to

  • UCLouvain students and researchers
  • Non-UCLouvain parties